Transformer Tester ST2840BX

Name: Transformer Tester ST2840BX
SKU: 64352
Availability: InStock

Product number: 64352

EAN: 4260689523689

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Details

Fachberatung unter
+49 421 277 9999

Description

Product information "Transformer Tester ST2840BX"

Highlights

Frequency: 20Hz - 2MHz
Accuracy: 0.01%
Display:

10.1" Capacitive Touch Screen
Resolution: 1280×RGB×800

The bias voltage is built-in ±40V/±100mA/2A
Interfaces: LAN, USB, RS232C, RS485, Handler, External DC BIAS Control
Optional LCR Function

Technical Data

Test speed up to 1800 times/s (>10kHz), without relay action time
Test level up to 20Vrms
The bias voltage is built-in ±40V/±100mA/2A
Industry-friendly user experience: Linux bottom layer, built-in help file
10.1 inch 1280×800 capacitive touch screen
Graphical pin association setting page, so that wiring is no longer a problem
Lk setting does not need to input the leakage inductance pin, which is more intuitive
Enhanced balance scanning function, from 5 points to 10 points
Range switching adopts electronic switch, fast speed, long life, no noise
Optional LCR function
Approximately 100M setting file storage space in the machine, and massive U disk setting file storage capacity
Provide host computer to support early model file format conversion to ensure compatibility

Applications

Switching transformer scanning test, comprehensive characteristics analysis.
Network transformer scanning test, comprehensive characteristics analysis
Discrete passive components (L, R, C) multi-channel scanning test
Relay drive line package, contact resistance multi-channel scanning test
Multi-channel DC resistance DCR scanning test
Comprehensive test analysis of multiple passive components in impedance network

What’s in the box

Kelvin test lead ST26011BS
Connection Cable ST26058A
Test line ST26004B
Manual transformer ST1806B
Foot switch ST1801-001

Downloads

EN - ST2840 User Manual (17.53 MB)

Technical data

Specifications

Model		ST2840AX	ST2840BX	ST2840NX
Display	Display	10.1" Captive Touch Screen
	Ratio	16:09
	Resolution	1280×RGB×800
Test PIN		20PIN(By TH1806)		48PIN(Can extend to 288PIN)
Frequency	Range	20Hz-500kHz	20Hz-2MHz	20Hz-500kHz
	Accuracy	0.01%
	Resolution	0.1mHz (20.0000Hz-99.9999Hz)
		1mHz (100.000Hz-999.999Hz)
		10mHz (1.00000kHz-9.99999kHz)
		100mHz (10.0000kHz-99.9999kHz)
		1Hz (100.000kHz-999.999kHz )
		10Hz (1.00000MHz-2.00000MHz)
AC test signal mode	Rated value (ALC OFF)	Set the voltage as the Hcur voltage when the test terminal is open
		Set the current to be the current flowing from Hcur when the test terminal is short-circuited
	Constant value (ALC ON)	Keep the voltage on the DUT the same as the set value
		Keep the current on the DUT the same as the set value
Test Level	AC Voltage	5mVrms-20Vrms	F<=1MHz 5mVrms-20Vrms	5mVrms-20Vrms
			F>1MHz 5mVrms-15Vrms
	Accuracy	±(10%×the set value+2mV)(AC<=2Vrms)
		±(10%×the set value+5mV)(AC＞2Vrms)
	Resolution	1mVrms (5mVrms-0.2Vrms)
		1mVrms (0.2Vrms-0.5Vrms)
		1mVrms (0.5Vrms-1Vrms)
		10mVrms (1Vrms-2Vrms)
		10mVrms (2Vrms-5Vrms)
		10mVrms (5Vrms-10Vrms)
		10mVrms (10Vrms-20Vrms)
	AC Current	50μArms-100mArms
	Resolution(100Ω Internal Resistance)	10μArms (50μArms-2mArms)
		10μArms (2mArms-5mArms)
		10μArms (5mArms-10mArms)
		100μArms (10mArms-20mArms)
		100μArms (20mArms-50mArms)
		100μArms (50mArms-100mArms)
RDC Test	Voltage	100mV-20V
	Resolution	1mV (0V-1V)
		10mV (1V-20V)
	Current	0mA-100mA
	Resolution	10μA (0mA-10mA)
		100μA (10mA-100mA)
DC Bias *	Voltage	0V-±40V
	Accuracy	AC<=2V 1%×the set voltage+5mV
		AC>2V 2%×the set voltage+8mV
	Resolution	1mV (0V - ±1V)
		10mV (±1V - ±40V)
	Current	0mA-±100mA
	Resolution	10μA (0mA-10mA)
		100μA (10mA-100mA)
Built-in current source	Current	0mA-2A
	Accuracy	I>5mA ±(2%×the set value+2mA)
	Resolution	1mA
Output impedance		30Ω, ±4%@1kHz
		100Ω, ±2%@1kHz
LCR Function
Test Parameter	Method	Arbitrary selection of four parameters
	AC	Cp/Cs, Lp/Ls, Rp/Rs, \|Z\|, \|Y\|, R, X, G, B, θ, D, Q, VAC, IAC
	DC	RDC, VDC, IDC
Test Terminal Configuration		Four Terminal Pair
Test Cable Length		0m
Computation		The absolute deviation from the nominal value Δ, the percentage deviation from the nominal value Δ%
Equivalent Way		Series, Parallel
Calibration Function		OPEN, SHORT, LOAD
Average Times		1-255
Range Selection		AUTO, HOLD
Range Configuration	LCR	100mΩ, 1Ω, 10Ω, 20Ω, 50Ω, 100Ω, 200Ω, 500Ω, 1kΩ, 2kΩ, 5kΩ, 10kΩ, 20kΩ, 50kΩ, 100kΩ
	RDC	1Ω, 10Ω, 20Ω, 50Ω, 100Ω, 200Ω, 500Ω, 1kΩ, 2kΩ, 5kΩ, 10kΩ, 20kΩ, 50kΩ, 100kΩ
Test Speed (ms)		Fast+: 1ms. Fast: 3.3ms. Middle: 90ms.
		Slow: 220ms
Highest accuracy		0.05% Please refer to the manuals for the details
Measurement display range
Cs, Cp		0.00001pF-9.99999F
Ls, Lp		0.00001μH-99.9999kH
D		0.00001-9.99999
Q		0.00001-99999.9
R, Rs, Rp, X, Z, RDC		0.001mΩ-99.9999MΩ
G, B, Y		0.00001μs-99.9999S
VDC		±0V-±999.999V
IDC		±0A-±999.999A
θr		-6.28318
θd		-179.999°-179.999°
Δ%		±(0.000%-999.9%)
TurnsRatio		1：0.001—1000：1
Transformer Test
Test Parameter		Cs/Cp, Ls/Lp, DCR, Zx, Rs/Rp, D, Q, dZ, , Lk, Phase, Balance Turns-Ratio, Ns:Np=U2/U1, Np:Ns=U1/U2 Turns: Ns=Np×U2/U1, Np=Ns×U1/U2
Test Mode	Continous	In the single trigger mode, manually trigger once, and once test all the test parameters.
	Step	In the single trigger mode, manually trigger once to measure one parameter. Trigger again to measure the next parameter.
Test Speed (ms)	Fast	Fast: 3.3ms, Fast+ 0.56ms(>10kHz)
	Middle	Middle: 90ms
	Slow	Slow: 220ms
Bias Resource		See *
Average Times		Each test parameter can set different average times, the average times is 0-255
Time Delay		Each test parameter can set a different delay time
Transformer Scanning
Built in Scanning Board		No		One Board as standard. Could extend to six boards. ((24×2)PIN per board)
Transformer Handler	PIN Definition	NS1-NS30, GOOD, NG, TEST, TRIGGER, RESET		NS1-NS9, GOOD, NG, TEST, TRIGGER, RESET
	Output characteristics	Optocoupler isolation, ULN2003 drive enhancement, collector output
Model		Direct reading, percentage
Test Range		Auto, Hold
Bias Resource		See *
External scanning box		compatible to TH1901 series, TH1831 scanning box, TH1806 series
Number of windings	Primary	60
	Secondary	9
Average Times		Each test parameter can set different average times, the average times is 0-255
Time Delay		Each test parameter can set a different delay time
Test Speed (ms)	Fast	Fast: 3.3ms(>=1kHz). Fast+ : 0.56ms(>=10kHz) (Exclude the time for the realy action)
	Middle	Middle: 90ms
	Slow	Slow: 220ms
Test lead interface		25*2pin FRC socket
Other Functions and specifications
Storage	Internal	About 100M non-volatile memory test setting file
	U Disk	Test setting file, screenshot graph, record file
Keyboard Lock		The front panel keys can be locked
Interface	USB HOST	2 USB HOST ports. Mouse and keyboard could work at the same time. Only one U disk can be used at the same time.
	USB DEVICE	Universal serial bus socket, small type B (4 contact positions); compatible with USB TMC-USB488 and USB2.0, the female connector is used to connect an external controller.
	LAN	10/100M Ethernet adaptive, 8 Pin
	HANDLER	Used for Bin signal output
	External DC BIAS Control	Support TH1778A (do not support transformer scanning)
	RS232C	Standard 9-pin, cross
	RS485	Can accept modification or connect to RS232 to RS485 adaptor
Power-on Warm-up Time		60 Minutes
Output Voltage		100-120VAC/198-242VAC Optional, 47-63Hz
Power Consumption		More than 130VA
Size (WxHxD) mm		430mm(W)x177mm(H)x265mm(D)		430mm(W)x177mm(H)x405mm(D)
Weight (kg)		11kg		17kg